A vertical distance-based outlier detection method with local pruning
Dongmei Ren, Imad Rahal, William Perrizo, Kirk Scott
- Anthology ID:
- DBLP:conf/cikm/RenRPS04
- Volume:
- Proceedings of the 2004 ACM CIKM International Conference on Information and Knowledge Management, Washington, DC, USA, November 8-13, 2004
- Year:
- 2004
- Venue:
- cikm_conference
- Publisher:
- ACM
- Pages:
- 279–284
- URL:
- https://doi.org/10.1145/1031171.1031232
- DOI:
- 10.1145/1031171.1031232
- DBLP:
- conf/cikm/RenRPS04
