Intrinsic Plagiarism Detection
Sven Meyer zu Eissen, Benno Stein
- Anthology ID:
- DBLP:conf/ecir/EissenS06
- Volume:
- Advances in Information Retrieval, 28th European Conference on IR Research, ECIR 2006, London, UK, April 10-12, 2006, Proceedings
- Year:
- 2006
- Venue:
- ecir_conference
- Publisher:
- Springer
- Pages:
- 565–569
- URL:
- https://doi.org/10.1007/11735106_66
- DOI:
- 10.1007/11735106_66
- DBLP:
- conf/ecir/EissenS06