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Hf-Based High-k Dielectrics: Process Development, Performance Characterization, and Reliability

Young-Hee Kim, Jack C. Lee


Anthology ID:
DBLP:series/synthesis/2006Kim
Volume:
2006
Year:
2006
Venue:
synthesis_series
Publisher:
Morgan & Claypool Publishers
URL:
https://doi.org/10.2200/S00005ED1V01Y200508SSM001
DOI:
10.2200/S00005ED1V01Y200508SSM001
DBLP:
series/synthesis/2006Kim
BibTeX:
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