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Test theory for assessing IR test collections

David Bodoff, Pu Li

Anthology ID:
DBLP:conf/sigir/BodoffL07
Volume:
SIGIR 2007: Proceedings of the 30th Annual International ACM SIGIR Conference on Research and Development in Information Retrieval, Amsterdam, The Netherlands, July 23-27, 2007
Year:
2007
Venue:
sigirconf_conference
Publisher:
ACM
Pages:
367–374
URL:
https://doi.org/10.1145/1277741.1277805
DOI:
10.1145/1277741.1277805
DBLP:
conf/sigir/BodoffL07
BibTeX:
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