Intrinsic Plagiarism Analysis with Meta Learning
Benno Stein, Sven Meyer zu Eissen
- Anthology ID:
- DBLP:conf/sigir/SteinE07
- Volume:
- Proceedings of the SIGIR 2007 International Workshop on Plagiarism Analysis, Authorship Identification, and Near-Duplicate Detection, PAN 2007, Amsterdam, Netherlands, July 27, 2007
- Year:
- 2007
- Venue:
- sigirconf_workshop
- Publisher:
- CEUR-WS.org
- URL:
- https://ceur-ws.org/Vol-276/paper7.pdf
- DBLP:
- conf/sigir/SteinE07
- PDF:
- https://ceur-ws.org/Vol-276/paper7.pdf
