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Semi-supervised metric learning by maximizing constraint margin

Fei Wang, Shouchun Chen, Changshui Zhang, Tao Li


Anthology ID:
DBLP:conf/cikm/WangCZL08
Volume:
Proceedings of the 17th ACM Conference on Information and Knowledge Management, CIKM 2008, Napa Valley, California, USA, October 26-30, 2008
Year:
2008
Venue:
cikm_conference
Publisher:
ACM
Pages:
1457–1458
URL:
https://doi.org/10.1145/1458082.1458331
DOI:
10.1145/1458082.1458331
DBLP:
conf/cikm/WangCZL08
BibTeX:
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