Relevance Levels for Patent Mining
- Anthology ID:
- DBLP:conf/ntcir/GeyL08a
- Volume:
- Proceedings of the 2nd International Workshop on Evaluating Information Access, EVIA 2008, National Center of Sciences, Tokyo, Japan, December 16, 2008
- Year:
- 2008
- Venue:
- ntcir_workshop
- Publisher:
- National Institute of Informatics (NII)
- URL:
- http://research.nii.ac.jp/ntcir/workshop/OnlineProceedings7/pdf/EVIA2008/10-EVIA2008-GeyF.pdf
- DBLP:
- conf/ntcir/GeyL08a
- PDF:
- http://research.nii.ac.jp/ntcir/workshop/OnlineProceedings7/pdf/EVIA2008/10-EVIA2008-GeyF.pdf
