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An Introduction to Logic Circuit Testing

Parag K. Lala


Anthology ID:
DBLP:series/synthesis/2008Lala
Volume:
2008
Year:
2008
Venue:
synthesis_series
Publisher:
Morgan & Claypool Publishers
URL:
https://doi.org/10.2200/S00149ED1V01Y200808DCS017
DOI:
10.2200/S00149ED1V01Y200808DCS017
DBLP:
series/synthesis/2008Lala
BibTeX:
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