Main » CIKM » 2009 » Proceedings of the 2nd International Workshop on Patent Information Retrieval, PaIR '09, Hong Kong, SAR, China, November 6, 2009 »

Using normalized alignment scores to detect incorrectly aligned segments

Andreas Türk

Anthology ID:
DBLP:conf/cikm/Turk09
Volume:
Proceedings of the 2nd International Workshop on Patent Information Retrieval, PaIR '09, Hong Kong, SAR, China, November 6, 2009
Year:
2009
Venue:
cikm_workshop
Publisher:
ACM
Pages:
25–28
URL:
https://doi.org/10.1145/1651343.1651349
DOI:
10.1145/1651343.1651349
DBLP:
conf/cikm/Turk09
BibTeX:
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