Aspects and analysis of patent test collections
Mihai Lupu, Florina Piroi, Allan Hanbury
- Anthology ID:
- DBLP:conf/cikm/LupuPH10
- Volume:
- Proceedings of the 3rd International Workshop on Patent Information Retrieval, PaIR '10, Toronto, ON, Canada, October 26, 2010
- Year:
- 2010
- Venue:
- cikm_workshop
- Publisher:
- ACM
- Pages:
- 17–22
- URL:
- https://doi.org/10.1145/1871888.1871892
- DOI:
- 10.1145/1871888.1871892
- DBLP:
- conf/cikm/LupuPH10
