Main » CIKM » 2010 » Proceedings of the 3rd International Workshop on Patent Information Retrieval, PaIR '10, Toronto, ON, Canada, October 26, 2010 »

Aspects and analysis of patent test collections

Mihai Lupu, Florina Piroi, Allan Hanbury


Anthology ID:
DBLP:conf/cikm/LupuPH10
Volume:
Proceedings of the 3rd International Workshop on Patent Information Retrieval, PaIR '10, Toronto, ON, Canada, October 26, 2010
Year:
2010
Venue:
cikm_workshop
Publisher:
ACM
Pages:
17–22
URL:
https://doi.org/10.1145/1871888.1871892
DOI:
10.1145/1871888.1871892
DBLP:
conf/cikm/LupuPH10
BibTeX:
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