Detection of text quality flaws as a one-class classification problem
Maik Anderka, Benno Stein, Nedim Lipka
- Anthology ID:
- DBLP:conf/cikm/AnderkaSL11
- Volume:
- Proceedings of the 20th ACM Conference on Information and Knowledge Management, CIKM 2011, Glasgow, United Kingdom, October 24-28, 2011
- Year:
- 2011
- Venue:
- cikm_conference
- Publisher:
- ACM
- Pages:
- 2313–2316
- URL:
- https://doi.org/10.1145/2063576.2063954
- DOI:
- 10.1145/2063576.2063954
- DBLP:
- conf/cikm/AnderkaSL11
