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Coarse-to-fine classification via parametric and nonparametric models for computer-aided diagnosis

Meizhu Liu, Le Lu, Xiaojing Ye, Shipeng Yu, Heng Huang


Anthology ID:
DBLP:conf/cikm/LuLYYH11
Volume:
Proceedings of the 20th ACM Conference on Information and Knowledge Management, CIKM 2011, Glasgow, United Kingdom, October 24-28, 2011
Year:
2011
Venue:
cikm_conference
Publisher:
ACM
Pages:
2509–2512
URL:
https://doi.org/10.1145/2063576.2064004
DOI:
10.1145/2063576.2064004
DBLP:
conf/cikm/LuLYYH11
BibTeX:
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