Patent overlay mapping: Visualizing technological distance
Luciano Kay, Nils C. Newman, Jan L. Youtie, Alan L. Porter, Ismael Ràfols
- Anthology ID:
- DBLP:journals/jasis/KayNYPR14
- Volume:
- 2014 Volume 65 Issue 12
- Year:
- 2014
- Venue:
- jasis_journal
- Pages:
- 2432–2443
- URL:
- https://doi.org/10.1002/asi.23146
- DOI:
- 10.1002/asi.23146
- DBLP:
- journals/jasis/KayNYPR14
