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Causal Relationship Detection in Archival Collections of Product Reviews for Understanding Technology Evolution

Yating Zhang, Adam Jatowt, Katsumi Tanaka


Anthology ID:
DBLP:journals/tois/ZhangJT16
Volume:
2016 Volume 35 Issue 1
Year:
2016
Venue:
tois_journal
Pages:
3:1–3:41
URL:
https://doi.org/10.1145/2937752
DOI:
10.1145/2937752
DBLP:
journals/tois/ZhangJT16
BibTeX:
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