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Fine-grained Patient Similarity Measuring using Deep Metric Learning

Jiazhi Ni, Jie Liu, Chenxin Zhang, Dan Ye, Zhirou Ma


Anthology ID:
DBLP:conf/cikm/Ni0ZYM17
Volume:
Proceedings of the 2017 ACM on Conference on Information and Knowledge Management, CIKM 2017, Singapore, November 06 - 10, 2017
Year:
2017
Venue:
cikm_conference
Publisher:
ACM
Pages:
1189–1198
URL:
https://doi.org/10.1145/3132847.3133022
DOI:
10.1145/3132847.3133022
DBLP:
conf/cikm/Ni0ZYM17
BibTeX:
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