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SemDia: Semantic Rule-Based Equipment Diagnostics Tool

Gulnar Mehdi, Evgeny Kharlamov, Ognjen Savkovic, Guohui Xiao, Elem Güzel Kalayci, Sebastian Brandt, Ian Horrocks, Mikhail Roshchin, Thomas A. Runkler


Anthology ID:
DBLP:conf/cikm/MehdiKSXKBHRR17
Volume:
Proceedings of the 2017 ACM on Conference on Information and Knowledge Management, CIKM 2017, Singapore, November 06 - 10, 2017
Year:
2017
Venue:
cikm_conference
Publisher:
ACM
Pages:
2507–2510
URL:
https://doi.org/10.1145/3132847.3133191
DOI:
10.1145/3132847.3133191
DBLP:
conf/cikm/MehdiKSXKBHRR17
BibTeX:
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