Measuring technological distance for patent mapping

Bowen Yan, Jianxi Luo

Anthology ID:

DBLP:journals/jasis/YanL17

Volume:

2017 Volume 68 Issue 2

Year:

2017

Venue:

jasis_journal

Pages:

423–437

URL:

https://doi.org/10.1002/asi.23664

DOI:

10.1002/asi.23664

DBLP:

journals/jasis/YanL17

BibTeX:

Download Copy BibTeX to Clipboard Copy Bibkey "yan-2017-measuring" to Clipboard

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