On Fine-Grained Relevance Scales
Kevin Roitero, Eddy Maddalena, Gianluca Demartini, Stefano Mizzaro
- Anthology ID:
- DBLP:conf/sigir/RoiteroMDM18
- Volume:
- The 41st International ACM SIGIR Conference on Research & Development in Information Retrieval, SIGIR 2018, Ann Arbor, MI, USA, July 08-12, 2018
- Year:
- 2018
- Venue:
- sigirconf_conference
- Publisher:
- ACM
- Pages:
- 675–684
- URL:
- https://doi.org/10.1145/3209978.3210052
- DOI:
- 10.1145/3209978.3210052
- DBLP:
- conf/sigir/RoiteroMDM18
