Identifying Facet Mismatches In Search Via Micrographs
Sriram Srinivasan, Nikhil S. Rao, Karthik Subbian, Lise Getoor
- Anthology ID:
- DBLP:conf/cikm/SrinivasanRSG19
- Volume:
- Proceedings of the 28th ACM International Conference on Information and Knowledge Management, CIKM 2019, Beijing, China, November 3-7, 2019
- Year:
- 2019
- Venue:
- cikm_conference
- Publisher:
- ACM
- Pages:
- 1663–1672
- URL:
- https://doi.org/10.1145/3357384.3357911
- DOI:
- 10.1145/3357384.3357911
- DBLP:
- conf/cikm/SrinivasanRSG19
