On the Reliability of Test Collections for Evaluating Systems of Different Types
Emine Yilmaz, Nick Craswell, Bhaskar Mitra, Daniel Campos
- Anthology ID:
- DBLP:conf/sigir/YilmazCMC20
- Volume:
- Proceedings of the 43rd International ACM SIGIR conference on research and development in Information Retrieval, SIGIR 2020, Virtual Event, China, July 25-30, 2020
- Year:
- 2020
- Venue:
- sigirconf_conference
- Publisher:
- ACM
- Pages:
- 2101–2104
- URL:
- https://doi.org/10.1145/3397271.3401317
- DOI:
- 10.1145/3397271.3401317
- DBLP:
- conf/sigir/YilmazCMC20
