Inferring Sensitive Attributes from Model Explanations

Vasisht Duddu, Antoine Boutet

Anthology ID:

DBLP:conf/cikm/DudduB22

Volume:

Proceedings of the 31st ACM International Conference on Information & Knowledge Management, Atlanta, GA, USA, October 17-21, 2022

Year:

2022

Venue:

cikm_conference

Publisher:

ACM

Pages:

416–425

URL:

https://doi.org/10.1145/3511808.3557362

DOI:

10.1145/3511808.3557362

DBLP:

conf/cikm/DudduB22

BibTeX:

Download Copy BibTeX to Clipboard Copy Bibkey "duddu-2022-inferring" to Clipboard

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