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Binary Classification with Positive Labeling Sources

Jieyu Zhang, Yujing Wang, Yaming Yang, Yang Luo, Alexander Ratner


Anthology ID:
DBLP:conf/cikm/ZhangW0LR22
Volume:
Proceedings of the 31st ACM International Conference on Information & Knowledge Management, Atlanta, GA, USA, October 17-21, 2022
Year:
2022
Venue:
cikm_conference
Publisher:
ACM
Pages:
4672–4676
URL:
https://doi.org/10.1145/3511808.3557552
DOI:
10.1145/3511808.3557552
DBLP:
conf/cikm/ZhangW0LR22
BibTeX:
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