Technological trend mining: identifying new technology opportunities using patent semantic analysis
Siyeong Yun, Woojin Cho, Chulhyun Kim, Sungjoo Lee
- Anthology ID:
- DBLP:journals/ipm/YunCKL22
- Volume:
- 2022 Volume 59 Issue 4
- Year:
- 2022
- Venue:
- ipm_journal
- Pages:
- 102993
- URL:
- https://doi.org/10.1016/j.ipm.2022.102993
- DOI:
- 10.1016/j.ipm.2022.102993
- DBLP:
- journals/ipm/YunCKL22
