Technostress causes cognitive overload in high-stress people: Eye tracking analysis in a virtual kiosk test
Se Young Kim, Hahyeon Park, Hongbum Kim, Joon Kim, Kyoungwon Seo
- Anthology ID:
- DBLP:journals/ipm/KimPKKS22
- Volume:
- 2022 Volume 59 Issue 6
- Year:
- 2022
- Venue:
- ipm_journal
- Pages:
- 103093
- URL:
- https://doi.org/10.1016/j.ipm.2022.103093
- DOI:
- 10.1016/j.ipm.2022.103093
- DBLP:
- journals/ipm/KimPKKS22
