Too Many Relevants: Whither Cranfield Test Collections?
Ellen M. Voorhees, Nick Craswell, Jimmy Lin
- Anthology ID:
- DBLP:conf/sigir/VoorheesCL22
- Volume:
- SIGIR '22: The 45th International ACM SIGIR Conference on Research and Development in Information Retrieval, Madrid, Spain, July 11 - 15, 2022
- Year:
- 2022
- Venue:
- sigirconf_conference
- Publisher:
- ACM
- Pages:
- 2970–2980
- URL:
- https://doi.org/10.1145/3477495.3531728
- DOI:
- 10.1145/3477495.3531728
- DBLP:
- conf/sigir/VoorheesCL22