Sven Meyer zu Eissen
2007
Intrinsic Plagiarism Analysis with Meta Learning
Benno Stein
|
Sven Meyer zu Eissen
Proceedings of the SIGIR 2007 International Workshop on Plagiarism Analysis, Authorship Identification, and Near-Duplicate Detection, PAN 2007, Amsterdam, Netherlands, July 27, 2007
Strategies for retrieving plagiarized documents
Benno Stein
|
Sven Meyer zu Eissen
|
Martin Potthast
SIGIR 2007: Proceedings of the 30th Annual International ACM SIGIR Conference on Research and Development in Information Retrieval, Amsterdam, The Netherlands, July 23-27, 2007
2006
Intrinsic Plagiarism Detection
Sven Meyer zu Eissen
|
Benno Stein
Advances in Information Retrieval, 28th European Conference on IR Research, ECIR 2006, London, UK, April 10-12, 2006, Proceedings