Learning from Graph: Mitigating Label Noise on Graph through Topological Feature Reconstruction.

Zhonghao Wang|Yuanchen Bei|Sheng Zhou|Zhiyao Zhou|Jiapei Fan|Hui Xue|Haishuai Wang|Jiajun Bu


Anthology ID:DBLP:conf/cikm/0002B0ZF0WB25
Volume:Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025
Year:2025
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:3261-3270
URL:https://doi.org/10.1145/3746252.3761185
DOI:https://doi.org/10.1145/3746252.3761185
DBLP:conf/cikm/0002B0ZF0WB25
BibTeX:
@inproceedings{wang-2025-learning, author = {Zhonghao Wang and Yuanchen Bei and Sheng Zhou and Zhiyao Zhou and Jiapei Fan and Hui Xue and Haishuai Wang and Jiajun Bu}, editor = {Meeyoung Cha and Carl Yang and Senjuti Basu Roy and Chanyoung Park and Zhenhui Jessie Li and Noseong Park and Carl Yang and Senjuti Basu Roy and Zhenhui Jessie Li and Jaap Kamps and Kijung Shin and Bryan Hooi and Lifang He}, title = {{Learning from Graph: Mitigating Label Noise on Graph through Topological Feature Reconstruction}}, booktitle = {{Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025}}, pages = {3261--3270}, publisher = {ACM}, year = {2025}, url = {https://doi.org/10.1145/3746252.3761185}, doi = {https://doi.org/10.1145/3746252.3761185} }