Detection of text quality flaws as a one-class classification problem.
Maik Anderka|Benno Stein|Nedim Lipka
| Anthology ID: | DBLP:conf/cikm/AnderkaSL11 |
|---|---|
| Volume: | Proceedings of the 20th ACM Conference on Information and Knowledge Management, CIKM 2011, Glasgow, United Kingdom, October 24-28, 2011 |
| Year: | 2011 |
| Venue: | International Conference on Information and Knowledge Management (CIKM) |
| Publisher: | ACM |
| Pages: | 2313-2316 |
| URL: | https://doi.org/10.1145/2063576.2063954 |
| DOI: | https://doi.org/10.1145/2063576.2063954 |
| DBLP: | conf/cikm/AnderkaSL11 |
| BibTeX: |
@inproceedings{anderka-2011-detection,
author = {Maik Anderka and
Benno Stein and
Nedim Lipka},
editor = {Craig Macdonald and
Iadh Ounis and
Ian Ruthven},
title = {{Detection of text quality flaws as a one-class classification problem}},
booktitle = {{Proceedings of the 20th ACM Conference on Information and Knowledge Management, CIKM 2011, Glasgow, United Kingdom, October 24-28, 2011}},
pages = {2313--2316},
publisher = {ACM},
year = {2011},
url = {https://doi.org/10.1145/2063576.2063954},
doi = {https://doi.org/10.1145/2063576.2063954}
}