Detection of text quality flaws as a one-class classification problem.

Maik Anderka|Benno Stein|Nedim Lipka


Anthology ID:DBLP:conf/cikm/AnderkaSL11
Volume:Proceedings of the 20th ACM Conference on Information and Knowledge Management, CIKM 2011, Glasgow, United Kingdom, October 24-28, 2011
Year:2011
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:2313-2316
URL:https://doi.org/10.1145/2063576.2063954
DOI:https://doi.org/10.1145/2063576.2063954
DBLP:conf/cikm/AnderkaSL11
BibTeX:
@inproceedings{anderka-2011-detection, author = {Maik Anderka and Benno Stein and Nedim Lipka}, editor = {Craig Macdonald and Iadh Ounis and Ian Ruthven}, title = {{Detection of text quality flaws as a one-class classification problem}}, booktitle = {{Proceedings of the 20th ACM Conference on Information and Knowledge Management, CIKM 2011, Glasgow, United Kingdom, October 24-28, 2011}}, pages = {2313--2316}, publisher = {ACM}, year = {2011}, url = {https://doi.org/10.1145/2063576.2063954}, doi = {https://doi.org/10.1145/2063576.2063954} }