Unsupervised Anomaly Detection & Diagnosis: A Stein Variational Gradient Descent Approach.
Zhichao Chen|Leilei Ding|Jianmin Huang|Zhixuan Chu|Qingyang Dai|Hao Wang
| Anthology ID: | DBLP:conf/cikm/ChenDHCDW23 |
|---|---|
| Volume: | Proceedings of the 32nd ACM International Conference on Information and Knowledge Management, CIKM 2023, Birmingham, United Kingdom, October 21-25, 2023 |
| Year: | 2023 |
| Venue: | International Conference on Information and Knowledge Management (CIKM) |
| Publisher: | ACM |
| Pages: | 3783-3787 |
| URL: | https://doi.org/10.1145/3583780.3615167 |
| DOI: | https://doi.org/10.1145/3583780.3615167 |
| DBLP: | conf/cikm/ChenDHCDW23 |
| BibTeX: |
@inproceedings{chen-2023-unsupervised,
author = {Zhichao Chen and
Leilei Ding and
Jianmin Huang and
Zhixuan Chu and
Qingyang Dai and
Hao Wang},
editor = {Ingo Frommholz and
Frank Hopfgartner and
Mark Lee and
Michael P. Oakes and
Mounia Lalmas-Roelleke and
Min Zhang and
Rodrygo L. T. Santos},
title = {{Unsupervised Anomaly Detection & Diagnosis: A Stein Variational Gradient Descent Approach}},
booktitle = {{Proceedings of the 32nd ACM International Conference on Information and Knowledge Management, CIKM 2023, Birmingham, United Kingdom, October 21-25, 2023}},
pages = {3783--3787},
publisher = {ACM},
year = {2023},
url = {https://doi.org/10.1145/3583780.3615167},
doi = {https://doi.org/10.1145/3583780.3615167}
}