Unsupervised Anomaly Detection & Diagnosis: A Stein Variational Gradient Descent Approach.

Zhichao Chen|Leilei Ding|Jianmin Huang|Zhixuan Chu|Qingyang Dai|Hao Wang


Anthology ID:DBLP:conf/cikm/ChenDHCDW23
Volume:Proceedings of the 32nd ACM International Conference on Information and Knowledge Management, CIKM 2023, Birmingham, United Kingdom, October 21-25, 2023
Year:2023
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:3783-3787
URL:https://doi.org/10.1145/3583780.3615167
DOI:https://doi.org/10.1145/3583780.3615167
DBLP:conf/cikm/ChenDHCDW23
BibTeX:
@inproceedings{chen-2023-unsupervised, author = {Zhichao Chen and Leilei Ding and Jianmin Huang and Zhixuan Chu and Qingyang Dai and Hao Wang}, editor = {Ingo Frommholz and Frank Hopfgartner and Mark Lee and Michael P. Oakes and Mounia Lalmas-Roelleke and Min Zhang and Rodrygo L. T. Santos}, title = {{Unsupervised Anomaly Detection & Diagnosis: A Stein Variational Gradient Descent Approach}}, booktitle = {{Proceedings of the 32nd ACM International Conference on Information and Knowledge Management, CIKM 2023, Birmingham, United Kingdom, October 21-25, 2023}}, pages = {3783--3787}, publisher = {ACM}, year = {2023}, url = {https://doi.org/10.1145/3583780.3615167}, doi = {https://doi.org/10.1145/3583780.3615167} }