Automated Nanoparticle Image Processing Pipeline for AI-Driven Materials Characterization.

Alexandra L. Day|Carolin B. Wahl|Roberto dos Reis|Wei-keng Liao|Vinayak P. Dravid|Alok N. Choudhary|Ankit Agrawal


Anthology ID:DBLP:conf/cikm/DayWRLDC024
Volume:Proceedings of the 33rd ACM International Conference on Information and Knowledge Management, CIKM 2024, Boise, ID, USA, October 21-25, 2024
Year:2024
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:4462-4469
URL:https://doi.org/10.1145/3627673.3680100
DOI:https://doi.org/10.1145/3627673.3680100
DBLP:conf/cikm/DayWRLDC024
BibTeX:
@inproceedings{day-2024-automated, author = {Alexandra L. Day and Carolin B. Wahl and Roberto dos Reis and Wei-keng Liao and Vinayak P. Dravid and Alok N. Choudhary and Ankit Agrawal}, editor = {Edoardo Serra and Francesca Spezzano}, title = {{Automated Nanoparticle Image Processing Pipeline for AI-Driven Materials Characterization}}, booktitle = {{Proceedings of the 33rd ACM International Conference on Information and Knowledge Management, CIKM 2024, Boise, ID, USA, October 21-25, 2024}}, pages = {4462--4469}, publisher = {ACM}, year = {2024}, url = {https://doi.org/10.1145/3627673.3680100}, doi = {https://doi.org/10.1145/3627673.3680100} }