Automated Nanoparticle Image Processing Pipeline for AI-Driven Materials Characterization.
Alexandra L. Day|Carolin B. Wahl|Roberto dos Reis|Wei-keng Liao|Vinayak P. Dravid|Alok N. Choudhary|Ankit Agrawal
| Anthology ID: | DBLP:conf/cikm/DayWRLDC024 |
|---|---|
| Volume: | Proceedings of the 33rd ACM International Conference on Information and Knowledge Management, CIKM 2024, Boise, ID, USA, October 21-25, 2024 |
| Year: | 2024 |
| Venue: | International Conference on Information and Knowledge Management (CIKM) |
| Publisher: | ACM |
| Pages: | 4462-4469 |
| URL: | https://doi.org/10.1145/3627673.3680100 |
| DOI: | https://doi.org/10.1145/3627673.3680100 |
| DBLP: | conf/cikm/DayWRLDC024 |
| BibTeX: |
@inproceedings{day-2024-automated,
author = {Alexandra L. Day and
Carolin B. Wahl and
Roberto dos Reis and
Wei-keng Liao and
Vinayak P. Dravid and
Alok N. Choudhary and
Ankit Agrawal},
editor = {Edoardo Serra and
Francesca Spezzano},
title = {{Automated Nanoparticle Image Processing Pipeline for AI-Driven Materials Characterization}},
booktitle = {{Proceedings of the 33rd ACM International Conference on Information and Knowledge Management, CIKM 2024, Boise, ID, USA, October 21-25, 2024}},
pages = {4462--4469},
publisher = {ACM},
year = {2024},
url = {https://doi.org/10.1145/3627673.3680100},
doi = {https://doi.org/10.1145/3627673.3680100}
}