e-NSP: efficient negative sequential pattern mining based on identified positive patterns without database rescanning.

Xiangjun Dong|Zhigang Zheng|Longbing Cao|Yanchang Zhao|Chengqi Zhang|Jinjiu Li|Wei Wei|Yuming Ou


Anthology ID:DBLP:conf/cikm/DongZCZZLWO11
Volume:Proceedings of the 20th ACM Conference on Information and Knowledge Management, CIKM 2011, Glasgow, United Kingdom, October 24-28, 2011
Year:2011
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:825-830
URL:https://doi.org/10.1145/2063576.2063695
DOI:https://doi.org/10.1145/2063576.2063695
DBLP:conf/cikm/DongZCZZLWO11
BibTeX:
@inproceedings{dong-2011-ensp, author = {Xiangjun Dong and Zhigang Zheng and Longbing Cao and Yanchang Zhao and Chengqi Zhang and Jinjiu Li and Wei Wei and Yuming Ou}, editor = {Craig Macdonald and Iadh Ounis and Ian Ruthven}, title = {{e-NSP: efficient negative sequential pattern mining based on identified positive patterns without database rescanning}}, booktitle = {{Proceedings of the 20th ACM Conference on Information and Knowledge Management, CIKM 2011, Glasgow, United Kingdom, October 24-28, 2011}}, pages = {825--830}, publisher = {ACM}, year = {2011}, url = {https://doi.org/10.1145/2063576.2063695}, doi = {https://doi.org/10.1145/2063576.2063695} }