e-NSP: efficient negative sequential pattern mining based on identified positive patterns without database rescanning.
Xiangjun Dong|Zhigang Zheng|Longbing Cao|Yanchang Zhao|Chengqi Zhang|Jinjiu Li|Wei Wei|Yuming Ou
| Anthology ID: | DBLP:conf/cikm/DongZCZZLWO11 |
|---|---|
| Volume: | Proceedings of the 20th ACM Conference on Information and Knowledge Management, CIKM 2011, Glasgow, United Kingdom, October 24-28, 2011 |
| Year: | 2011 |
| Venue: | International Conference on Information and Knowledge Management (CIKM) |
| Publisher: | ACM |
| Pages: | 825-830 |
| URL: | https://doi.org/10.1145/2063576.2063695 |
| DOI: | https://doi.org/10.1145/2063576.2063695 |
| DBLP: | conf/cikm/DongZCZZLWO11 |
| BibTeX: |
@inproceedings{dong-2011-ensp,
author = {Xiangjun Dong and
Zhigang Zheng and
Longbing Cao and
Yanchang Zhao and
Chengqi Zhang and
Jinjiu Li and
Wei Wei and
Yuming Ou},
editor = {Craig Macdonald and
Iadh Ounis and
Ian Ruthven},
title = {{e-NSP: efficient negative sequential pattern mining based on identified positive patterns without database rescanning}},
booktitle = {{Proceedings of the 20th ACM Conference on Information and Knowledge Management, CIKM 2011, Glasgow, United Kingdom, October 24-28, 2011}},
pages = {825--830},
publisher = {ACM},
year = {2011},
url = {https://doi.org/10.1145/2063576.2063695},
doi = {https://doi.org/10.1145/2063576.2063695}
}