Inferring Sensitive Attributes from Model Explanations.

Vasisht Duddu|Antoine Boutet


Anthology ID:DBLP:conf/cikm/DudduB22
Volume:Proceedings of the 31st ACM International Conference on Information & Knowledge Management, Atlanta, GA, USA, October 17-21, 2022
Year:2022
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:416-425
URL:https://doi.org/10.1145/3511808.3557362
DOI:https://doi.org/10.1145/3511808.3557362
DBLP:conf/cikm/DudduB22
BibTeX:
@inproceedings{duddu-2022-inferring, author = {Vasisht Duddu and Antoine Boutet}, editor = {Mohammad Al Hasan and Li Xiong}, title = {{Inferring Sensitive Attributes from Model Explanations}}, booktitle = {{Proceedings of the 31st ACM International Conference on Information & Knowledge Management, Atlanta, GA, USA, October 17-21, 2022}}, pages = {416--425}, publisher = {ACM}, year = {2022}, url = {https://doi.org/10.1145/3511808.3557362}, doi = {https://doi.org/10.1145/3511808.3557362} }