Knowledge-Enhanced Multi-Label Few-Shot Product Attribute-Value Extraction.

Jiaying Gong|Wei-Te Chen|Hoda Eldardiry


Anthology ID:DBLP:conf/cikm/GongCE23
Volume:Proceedings of the 32nd ACM International Conference on Information and Knowledge Management, CIKM 2023, Birmingham, United Kingdom, October 21-25, 2023
Year:2023
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:3902-3907
URL:https://doi.org/10.1145/3583780.3615142
DOI:https://doi.org/10.1145/3583780.3615142
DBLP:conf/cikm/GongCE23
BibTeX:
@inproceedings{gong-2023-knowledgeenhanced, author = {Jiaying Gong and Wei-Te Chen and Hoda Eldardiry}, editor = {Ingo Frommholz and Frank Hopfgartner and Mark Lee and Michael P. Oakes and Mounia Lalmas-Roelleke and Min Zhang and Rodrygo L. T. Santos}, title = {{Knowledge-Enhanced Multi-Label Few-Shot Product Attribute-Value Extraction}}, booktitle = {{Proceedings of the 32nd ACM International Conference on Information and Knowledge Management, CIKM 2023, Birmingham, United Kingdom, October 21-25, 2023}}, pages = {3902--3907}, publisher = {ACM}, year = {2023}, url = {https://doi.org/10.1145/3583780.3615142}, doi = {https://doi.org/10.1145/3583780.3615142} }