Knowledge-Enhanced Multi-Label Few-Shot Product Attribute-Value Extraction.
Jiaying Gong|Wei-Te Chen|Hoda Eldardiry
| Anthology ID: | DBLP:conf/cikm/GongCE23 |
|---|---|
| Volume: | Proceedings of the 32nd ACM International Conference on Information and Knowledge Management, CIKM 2023, Birmingham, United Kingdom, October 21-25, 2023 |
| Year: | 2023 |
| Venue: | International Conference on Information and Knowledge Management (CIKM) |
| Publisher: | ACM |
| Pages: | 3902-3907 |
| URL: | https://doi.org/10.1145/3583780.3615142 |
| DOI: | https://doi.org/10.1145/3583780.3615142 |
| DBLP: | conf/cikm/GongCE23 |
| BibTeX: |
@inproceedings{gong-2023-knowledgeenhanced,
author = {Jiaying Gong and
Wei-Te Chen and
Hoda Eldardiry},
editor = {Ingo Frommholz and
Frank Hopfgartner and
Mark Lee and
Michael P. Oakes and
Mounia Lalmas-Roelleke and
Min Zhang and
Rodrygo L. T. Santos},
title = {{Knowledge-Enhanced Multi-Label Few-Shot Product Attribute-Value Extraction}},
booktitle = {{Proceedings of the 32nd ACM International Conference on Information and Knowledge Management, CIKM 2023, Birmingham, United Kingdom, October 21-25, 2023}},
pages = {3902--3907},
publisher = {ACM},
year = {2023},
url = {https://doi.org/10.1145/3583780.3615142},
doi = {https://doi.org/10.1145/3583780.3615142}
}