Out of Distribution Detection for Efficient Continual Learning in Quality Prediction for Arc Welding.

Yannik Hahn|Jan Voets|Antonin Königsfeld|Hasan Tercan|Tobias Meisen


Anthology ID:DBLP:conf/cikm/HahnVKTM25
Volume:Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025
Year:2025
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:5699-5706
URL:https://doi.org/10.1145/3746252.3761535
DOI:https://doi.org/10.1145/3746252.3761535
DBLP:conf/cikm/HahnVKTM25
BibTeX:
@inproceedings{hahn-2025-distribution, author = {Yannik Hahn and Jan Voets and Antonin K\"{o}nigsfeld and Hasan Tercan and Tobias Meisen}, editor = {Meeyoung Cha and Carl Yang and Senjuti Basu Roy and Chanyoung Park and Zhenhui Jessie Li and Noseong Park and Carl Yang and Senjuti Basu Roy and Zhenhui Jessie Li and Jaap Kamps and Kijung Shin and Bryan Hooi and Lifang He}, title = {{Out of Distribution Detection for Efficient Continual Learning in Quality Prediction for Arc Welding}}, booktitle = {{Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025}}, pages = {5699--5706}, publisher = {ACM}, year = {2025}, url = {https://doi.org/10.1145/3746252.3761535}, doi = {https://doi.org/10.1145/3746252.3761535} }