Out of Distribution Detection for Efficient Continual Learning in Quality Prediction for Arc Welding.
Yannik Hahn|Jan Voets|Antonin Königsfeld|Hasan Tercan|Tobias Meisen
| Anthology ID: | DBLP:conf/cikm/HahnVKTM25 |
|---|---|
| Volume: | Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025 |
| Year: | 2025 |
| Venue: | International Conference on Information and Knowledge Management (CIKM) |
| Publisher: | ACM |
| Pages: | 5699-5706 |
| URL: | https://doi.org/10.1145/3746252.3761535 |
| DOI: | https://doi.org/10.1145/3746252.3761535 |
| DBLP: | conf/cikm/HahnVKTM25 |
| BibTeX: |
@inproceedings{hahn-2025-distribution,
author = {Yannik Hahn and
Jan Voets and
Antonin K\"{o}nigsfeld and
Hasan Tercan and
Tobias Meisen},
editor = {Meeyoung Cha and
Carl Yang and
Senjuti Basu Roy and
Chanyoung Park and
Zhenhui Jessie Li and
Noseong Park and
Carl Yang and
Senjuti Basu Roy and
Zhenhui Jessie Li and
Jaap Kamps and
Kijung Shin and
Bryan Hooi and
Lifang He},
title = {{Out of Distribution Detection for Efficient Continual Learning in Quality Prediction for Arc Welding}},
booktitle = {{Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025}},
pages = {5699--5706},
publisher = {ACM},
year = {2025},
url = {https://doi.org/10.1145/3746252.3761535},
doi = {https://doi.org/10.1145/3746252.3761535}
}