Development of Autonomous Failure Maintenance System for Semiconductor Manufacturing.
Nuri Han|Jiwon Seo|Jonghee Ha|Jihyung Oh|Jinwoo Lee|Boram Jeong|Jongbin Park|Gilhwan Kim|Yohwan Joo
| Anthology ID: | DBLP:conf/cikm/HanSHOLJPKJ25 |
|---|---|
| Volume: | Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025 |
| Year: | 2025 |
| Venue: | International Conference on Information and Knowledge Management (CIKM) |
| Publisher: | ACM |
| Pages: | 5723-5730 |
| URL: | https://doi.org/10.1145/3746252.3761556 |
| DOI: | https://doi.org/10.1145/3746252.3761556 |
| DBLP: | conf/cikm/HanSHOLJPKJ25 |
| BibTeX: |
@inproceedings{han-2025-development,
author = {Nuri Han and
Jiwon Seo and
Jonghee Ha and
Jihyung Oh and
Jinwoo Lee and
Boram Jeong and
Jongbin Park and
Gilhwan Kim and
Yohwan Joo},
editor = {Meeyoung Cha and
Carl Yang and
Senjuti Basu Roy and
Chanyoung Park and
Zhenhui Jessie Li and
Noseong Park and
Carl Yang and
Senjuti Basu Roy and
Zhenhui Jessie Li and
Jaap Kamps and
Kijung Shin and
Bryan Hooi and
Lifang He},
title = {{Development of Autonomous Failure Maintenance System for Semiconductor Manufacturing}},
booktitle = {{Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025}},
pages = {5723--5730},
publisher = {ACM},
year = {2025},
url = {https://doi.org/10.1145/3746252.3761556},
doi = {https://doi.org/10.1145/3746252.3761556}
}