Learning a two-stage SVM/CRF sequence classifier.

Guilherme Hoefel|Charles Elkan


Anthology ID:DBLP:conf/cikm/HoefelE08
Volume:Proceedings of the 17th ACM Conference on Information and Knowledge Management, CIKM 2008, Napa Valley, California, USA, October 26-30, 2008
Year:2008
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:271-278
URL:https://doi.org/10.1145/1458082.1458120
DOI:https://doi.org/10.1145/1458082.1458120
DBLP:conf/cikm/HoefelE08
BibTeX:
@inproceedings{hoefel-2008-learning, author = {Guilherme Hoefel and Charles Elkan}, editor = {James G. Shanahan and Sihem Amer-Yahia and Ioana Manolescu and Yi Zhang and David A. Evans and Alek Kolcz and Key-Sun Choi and Abdur Chowdhury}, title = {{Learning a two-stage SVM/CRF sequence classifier}}, booktitle = {{Proceedings of the 17th ACM Conference on Information and Knowledge Management, CIKM 2008, Napa Valley, California, USA, October 26-30, 2008}}, pages = {271--278}, publisher = {ACM}, year = {2008}, url = {https://doi.org/10.1145/1458082.1458120}, doi = {https://doi.org/10.1145/1458082.1458120} }