System Deterioration Detection and Root Cause Learning on Time Series Graphs.

Hao Huang|Shinjae Yoo|Yunwen Xu


Anthology ID:DBLP:conf/cikm/HuangYX19
Volume:Proceedings of the 28th ACM International Conference on Information and Knowledge Management, CIKM 2019, Beijing, China, November 3-7, 2019.
Year:2019
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:2537-2545
URL:https://doi.org/10.1145/3357384.3357802
DOI:https://doi.org/10.1145/3357384.3357802
DBLP:conf/cikm/HuangYX19
BibTeX:
@inproceedings{huang-2019-system, author = {Hao Huang and Shinjae Yoo and Yunwen Xu}, editor = {Wenwu Zhu and Dacheng Tao and Xueqi Cheng and Peng Cui and Elke A. Rundensteiner and David Carmel and Qi He and Jeffrey Xu Yu}, title = {{System Deterioration Detection and Root Cause Learning on Time Series Graphs}}, booktitle = {{Proceedings of the 28th ACM International Conference on Information and Knowledge Management, CIKM 2019, Beijing, China, November 3-7, 2019}}, pages = {2537--2545}, publisher = {ACM}, year = {2019}, url = {https://doi.org/10.1145/3357384.3357802}, doi = {https://doi.org/10.1145/3357384.3357802} }