Deep Variational Bayesian Modeling of Haze Degradation Process.

Eun Woo Im|Junsung Shin|Sungyong Baik|Tae Hyun Kim


Anthology ID:DBLP:conf/cikm/ImSBK23
Volume:Proceedings of the 32nd ACM International Conference on Information and Knowledge Management, CIKM 2023, Birmingham, United Kingdom, October 21-25, 2023
Year:2023
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:895-904
URL:https://doi.org/10.1145/3583780.3614838
DOI:https://doi.org/10.1145/3583780.3614838
DBLP:conf/cikm/ImSBK23
BibTeX:
@inproceedings{im-2023-deep, author = {Eun Woo Im and Junsung Shin and Sungyong Baik and Tae Hyun Kim}, editor = {Ingo Frommholz and Frank Hopfgartner and Mark Lee and Michael P. Oakes and Mounia Lalmas-Roelleke and Min Zhang and Rodrygo L. T. Santos}, title = {{Deep Variational Bayesian Modeling of Haze Degradation Process}}, booktitle = {{Proceedings of the 32nd ACM International Conference on Information and Knowledge Management, CIKM 2023, Birmingham, United Kingdom, October 21-25, 2023}}, pages = {895--904}, publisher = {ACM}, year = {2023}, url = {https://doi.org/10.1145/3583780.3614838}, doi = {https://doi.org/10.1145/3583780.3614838} }