Seeing Through the Blur: Unlocking Defocus Maps for Deepfake Detection.

Minsun Jeon|Simon S. Woo


Anthology ID:DBLP:conf/cikm/JeonW25
Volume:Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025
Year:2025
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:1091-1102
URL:https://doi.org/10.1145/3746252.3761260
DOI:https://doi.org/10.1145/3746252.3761260
DBLP:conf/cikm/JeonW25
BibTeX:
@inproceedings{jeon-2025-seeing, author = {Minsun Jeon and Simon S. Woo}, editor = {Carl Yang and Meeyoung Cha and Senjuti Basu Roy and Chanyoung Park and Zhenhui Jessie Li and Noseong Park and Carl Yang and Senjuti Basu Roy and Zhenhui Jessie Li and Jaap Kamps and Kijung Shin and Bryan Hooi and Lifang He}, title = {{Seeing Through the Blur: Unlocking Defocus Maps for Deepfake Detection}}, booktitle = {{Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025}}, pages = {1091--1102}, publisher = {ACM}, year = {2025}, url = {https://doi.org/10.1145/3746252.3761260}, doi = {https://doi.org/10.1145/3746252.3761260} }