Computer Image Retrieval by Features: Selecting the Best Facial Features for Suspect Identification Systems.

Eric S. Lee|Thomas Whalen


Anthology ID:DBLP:conf/cikm/LeeW94
Volume:Proceedings of the Third International Conference on Information and Knowledge Management (CIKM'94), Gaithersburg, Maryland, USA, November 29 - December 2, 1994
Year:1994
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:105-111
URL:https://doi.org/10.1145/191246.191266
DOI:https://doi.org/10.1145/191246.191266
DBLP:conf/cikm/LeeW94
BibTeX:
@inproceedings{lee-1994-computer, author = {Eric S. Lee and Thomas Whalen}, title = {{Computer Image Retrieval by Features: Selecting the Best Facial Features for Suspect Identification Systems}}, booktitle = {{Proceedings of the Third International Conference on Information and Knowledge Management (CIKM'94), Gaithersburg, Maryland, USA, November 29 - December 2, 1994}}, pages = {105--111}, publisher = {ACM}, year = {1994}, url = {https://doi.org/10.1145/191246.191266}, doi = {https://doi.org/10.1145/191246.191266} }