Fast Outlier Detection in Oblique Subspaces.

Bowen Li|Charu C. Aggarwal|Peixiang Zhao


Anthology ID:DBLP:conf/cikm/LiA025
Volume:Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025
Year:2025
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:1530-1539
URL:https://doi.org/10.1145/3746252.3761354
DOI:https://doi.org/10.1145/3746252.3761354
DBLP:conf/cikm/LiA025
BibTeX:
@inproceedings{li-2025-fast, author = {Bowen Li and Charu C. Aggarwal and Peixiang Zhao}, editor = {Meeyoung Cha and Carl Yang and Senjuti Basu Roy and Chanyoung Park and Zhenhui Jessie Li and Noseong Park and Carl Yang and Senjuti Basu Roy and Zhenhui Jessie Li and Jaap Kamps and Kijung Shin and Bryan Hooi and Lifang He}, title = {{Fast Outlier Detection in Oblique Subspaces}}, booktitle = {{Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025}}, pages = {1530--1539}, publisher = {ACM}, year = {2025}, url = {https://doi.org/10.1145/3746252.3761354}, doi = {https://doi.org/10.1145/3746252.3761354} }