Fast Outlier Detection in Oblique Subspaces.
Bowen Li|Charu C. Aggarwal|Peixiang Zhao
| Anthology ID: | DBLP:conf/cikm/LiA025 |
|---|---|
| Volume: | Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025 |
| Year: | 2025 |
| Venue: | International Conference on Information and Knowledge Management (CIKM) |
| Publisher: | ACM |
| Pages: | 1530-1539 |
| URL: | https://doi.org/10.1145/3746252.3761354 |
| DOI: | https://doi.org/10.1145/3746252.3761354 |
| DBLP: | conf/cikm/LiA025 |
| BibTeX: |
@inproceedings{li-2025-fast,
author = {Bowen Li and
Charu C. Aggarwal and
Peixiang Zhao},
editor = {Meeyoung Cha and
Carl Yang and
Senjuti Basu Roy and
Chanyoung Park and
Zhenhui Jessie Li and
Noseong Park and
Carl Yang and
Senjuti Basu Roy and
Zhenhui Jessie Li and
Jaap Kamps and
Kijung Shin and
Bryan Hooi and
Lifang He},
title = {{Fast Outlier Detection in Oblique Subspaces}},
booktitle = {{Proceedings of the 34th ACM International Conference on Information and Knowledge Management, CIKM 2025, Seoul, Republic of Korea, November 10-14, 2025}},
pages = {1530--1539},
publisher = {ACM},
year = {2025},
url = {https://doi.org/10.1145/3746252.3761354},
doi = {https://doi.org/10.1145/3746252.3761354}
}