Aspects and analysis of patent test collections.
Mihai Lupu|Florina Piroi|Allan Hanbury
| Anthology ID: | DBLP:conf/cikm/LupuPH10 |
|---|---|
| Volume: | Proceedings of the 3rd International Workshop on Patent Information Retrieval, PaIR '10, Toronto, ON, Canada, October 26, 2010 |
| Year: | 2010 |
| Venue: | Workshop on Patent Information Retrieval (PaIR) |
| Publisher: | ACM |
| Pages: | 17-22 |
| URL: | https://doi.org/10.1145/1871888.1871892 |
| DOI: | https://doi.org/10.1145/1871888.1871892 |
| DBLP: | conf/cikm/LupuPH10 |
| BibTeX: |
@inproceedings{lupu-2010-aspects,
author = {Mihai Lupu and
Florina Piroi and
Allan Hanbury},
editor = {John Tait and
Christopher G. Harris and
Mihai Lupu},
title = {{Aspects and analysis of patent test collections}},
booktitle = {{Proceedings of the 3rd International Workshop on Patent Information Retrieval, PaIR '10, Toronto, ON, Canada, October 26, 2010}},
pages = {17--22},
publisher = {ACM},
year = {2010},
url = {https://doi.org/10.1145/1871888.1871892},
doi = {https://doi.org/10.1145/1871888.1871892}
}