SemDia: Semantic Rule-Based Equipment Diagnostics Tool.

Gulnar Mehdi|Evgeny Kharlamov|Ognjen Savkovic|Guohui Xiao|Elem Güzel Kalayci|Sebastian Brandt|Ian Horrocks|Mikhail Roshchin|Thomas A. Runkler


Anthology ID:DBLP:conf/cikm/MehdiKSXKBHRR17
Volume:Proceedings of the 2017 ACM on Conference on Information and Knowledge Management, CIKM 2017, Singapore, November 06 - 10, 2017
Year:2017
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:2507-2510
URL:https://doi.org/10.1145/3132847.3133191
DOI:https://doi.org/10.1145/3132847.3133191
DBLP:conf/cikm/MehdiKSXKBHRR17
BibTeX:
@inproceedings{mehdi-2017-semdia, author = {Gulnar Mehdi and Evgeny Kharlamov and Ognjen Savkovic and Guohui Xiao and Elem G\"{u}zel Kalayci and Sebastian Brandt and Ian Horrocks and Mikhail Roshchin and Thomas A. Runkler}, editor = {Ee-Peng Lim and Marianne Winslett and Mark Sanderson and Ada Wai-Chee Fu and Jimeng Sun and J. Shane Culpepper and Eric Lo and Joyce C. Ho and Debora Donato and Rakesh Agrawal and Yu Zheng and Carlos Castillo and Aixin Sun and Vincent S. Tseng and Chenliang Li}, title = {{SemDia: Semantic Rule-Based Equipment Diagnostics Tool}}, booktitle = {{Proceedings of the 2017 ACM on Conference on Information and Knowledge Management, CIKM 2017, Singapore, November 06 - 10, 2017}}, pages = {2507--2510}, publisher = {ACM}, year = {2017}, url = {https://doi.org/10.1145/3132847.3133191}, doi = {https://doi.org/10.1145/3132847.3133191} }