Deep Metric Learning Based on Rank-sensitive Optimization of Top-k Precision.

@inproceedings{muramoto-2020-deep, author = {Naoki Muramoto and Hai-Tao Yu}, editor = {Mathieu d'Aquin and Stefan Dietze and Claudia Hauff and Edward Curry and Philippe Cudr\'{e}-Mauroux}, title = {{Deep Metric Learning Based on Rank-sensitive Optimization of Top-k Precision}}, booktitle = {{CIKM '20: The 29th ACM International Conference on Information and Knowledge Management, Virtual Event, Ireland, October 19-23, 2020}}, pages = {2161--2164}, publisher = {ACM}, year = {2020}, url = {https://doi.org/10.1145/3340531.3412142}, doi = {https://doi.org/10.1145/3340531.3412142} }