Fine-grained Patient Similarity Measuring using Deep Metric Learning.

Jiazhi Ni|Jie Liu|Chenxin Zhang|Dan Ye|Zhirou Ma


Anthology ID:DBLP:conf/cikm/Ni0ZYM17
Volume:Proceedings of the 2017 ACM on Conference on Information and Knowledge Management, CIKM 2017, Singapore, November 06 - 10, 2017
Year:2017
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:1189-1198
URL:https://doi.org/10.1145/3132847.3133022
DOI:https://doi.org/10.1145/3132847.3133022
DBLP:conf/cikm/Ni0ZYM17
BibTeX:
@inproceedings{ni-2017-finegrained, author = {Jiazhi Ni and Jie Liu and Chenxin Zhang and Dan Ye and Zhirou Ma}, editor = {Ee-Peng Lim and Marianne Winslett and Mark Sanderson and Ada Wai-Chee Fu and Jimeng Sun and J. Shane Culpepper and Eric Lo and Joyce C. Ho and Debora Donato and Rakesh Agrawal and Yu Zheng and Carlos Castillo and Aixin Sun and Vincent S. Tseng and Chenliang Li}, title = {{Fine-grained Patient Similarity Measuring using Deep Metric Learning}}, booktitle = {{Proceedings of the 2017 ACM on Conference on Information and Knowledge Management, CIKM 2017, Singapore, November 06 - 10, 2017}}, pages = {1189--1198}, publisher = {ACM}, year = {2017}, url = {https://doi.org/10.1145/3132847.3133022}, doi = {https://doi.org/10.1145/3132847.3133022} }