A vertical distance-based outlier detection method with local pruning.

Dongmei Ren|Imad Rahal|William Perrizo|Kirk Scott


Anthology ID:DBLP:conf/cikm/RenRPS04
Volume:Proceedings of the 2004 ACM CIKM International Conference on Information and Knowledge Management, Washington, DC, USA, November 8-13, 2004
Year:2004
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:279-284
URL:https://doi.org/10.1145/1031171.1031232
DOI:https://doi.org/10.1145/1031171.1031232
DBLP:conf/cikm/RenRPS04
BibTeX:
@inproceedings{ren-2004-vertical, author = {Dongmei Ren and Imad Rahal and William Perrizo and Kirk Scott}, editor = {David A. Grossman and Luis Gravano and ChengXiang Zhai and Otthein Herzog and David A. Evans}, title = {{A vertical distance-based outlier detection method with local pruning}}, booktitle = {{Proceedings of the 2004 ACM CIKM International Conference on Information and Knowledge Management, Washington, DC, USA, November 8-13, 2004}}, pages = {279--284}, publisher = {ACM}, year = {2004}, url = {https://doi.org/10.1145/1031171.1031232}, doi = {https://doi.org/10.1145/1031171.1031232} }