A vertical distance-based outlier detection method with local pruning.
Dongmei Ren|Imad Rahal|William Perrizo|Kirk Scott
| Anthology ID: | DBLP:conf/cikm/RenRPS04 |
|---|---|
| Volume: | Proceedings of the 2004 ACM CIKM International Conference on Information and Knowledge Management, Washington, DC, USA, November 8-13, 2004 |
| Year: | 2004 |
| Venue: | International Conference on Information and Knowledge Management (CIKM) |
| Publisher: | ACM |
| Pages: | 279-284 |
| URL: | https://doi.org/10.1145/1031171.1031232 |
| DOI: | https://doi.org/10.1145/1031171.1031232 |
| DBLP: | conf/cikm/RenRPS04 |
| BibTeX: |
@inproceedings{ren-2004-vertical,
author = {Dongmei Ren and
Imad Rahal and
William Perrizo and
Kirk Scott},
editor = {David A. Grossman and
Luis Gravano and
ChengXiang Zhai and
Otthein Herzog and
David A. Evans},
title = {{A vertical distance-based outlier detection method with local pruning}},
booktitle = {{Proceedings of the 2004 ACM CIKM International Conference on Information and Knowledge Management, Washington, DC, USA, November 8-13, 2004}},
pages = {279--284},
publisher = {ACM},
year = {2004},
url = {https://doi.org/10.1145/1031171.1031232},
doi = {https://doi.org/10.1145/1031171.1031232}
}