Learning naïve bayes transfer classifier throughclass-wise test distribution estimation.
Jeong Woo Son|Seong-Bae Park|Hyun-Je Song
| Anthology ID: | DBLP:conf/cikm/SonPS10 |
|---|---|
| Volume: | Proceedings of the 19th ACM Conference on Information and Knowledge Management, CIKM 2010, Toronto, Ontario, Canada, October 26-30, 2010 |
| Year: | 2010 |
| Venue: | International Conference on Information and Knowledge Management (CIKM) |
| Publisher: | ACM |
| Pages: | 1729-1732 |
| URL: | https://doi.org/10.1145/1871437.1871715 |
| DOI: | https://doi.org/10.1145/1871437.1871715 |
| DBLP: | conf/cikm/SonPS10 |
| BibTeX: |
@inproceedings{son-2010-learning,
author = {Jeong Woo Son and
Seong-Bae Park and
Hyun-Je Song},
editor = {Jimmy Huang and
Nick Koudas and
Gareth J. F. Jones and
Xindong Wu and
Kevyn Collins-Thompson and
Aijun An},
title = {{Learning na\"{i}ve bayes transfer classifier throughclass-wise test distribution estimation}},
booktitle = {{Proceedings of the 19th ACM Conference on Information and Knowledge Management, CIKM 2010, Toronto, Ontario, Canada, October 26-30, 2010}},
pages = {1729--1732},
publisher = {ACM},
year = {2010},
url = {https://doi.org/10.1145/1871437.1871715},
doi = {https://doi.org/10.1145/1871437.1871715}
}