Learning naïve bayes transfer classifier throughclass-wise test distribution estimation.

Jeong Woo Son|Seong-Bae Park|Hyun-Je Song


Anthology ID:DBLP:conf/cikm/SonPS10
Volume:Proceedings of the 19th ACM Conference on Information and Knowledge Management, CIKM 2010, Toronto, Ontario, Canada, October 26-30, 2010
Year:2010
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:1729-1732
URL:https://doi.org/10.1145/1871437.1871715
DOI:https://doi.org/10.1145/1871437.1871715
DBLP:conf/cikm/SonPS10
BibTeX:
@inproceedings{son-2010-learning, author = {Jeong Woo Son and Seong-Bae Park and Hyun-Je Song}, editor = {Jimmy Huang and Nick Koudas and Gareth J. F. Jones and Xindong Wu and Kevyn Collins-Thompson and Aijun An}, title = {{Learning na\"{i}ve bayes transfer classifier throughclass-wise test distribution estimation}}, booktitle = {{Proceedings of the 19th ACM Conference on Information and Knowledge Management, CIKM 2010, Toronto, Ontario, Canada, October 26-30, 2010}}, pages = {1729--1732}, publisher = {ACM}, year = {2010}, url = {https://doi.org/10.1145/1871437.1871715}, doi = {https://doi.org/10.1145/1871437.1871715} }