Identifying Facet Mismatches In Search Via Micrographs.
Sriram Srinivasan|Nikhil S. Rao|Karthik Subbian|Lise Getoor
| Anthology ID: | DBLP:conf/cikm/SrinivasanRSG19 |
|---|---|
| Volume: | Proceedings of the 28th ACM International Conference on Information and Knowledge Management, CIKM 2019, Beijing, China, November 3-7, 2019. |
| Year: | 2019 |
| Venue: | International Conference on Information and Knowledge Management (CIKM) |
| Publisher: | ACM |
| Pages: | 1663-1672 |
| URL: | https://doi.org/10.1145/3357384.3357911 |
| DOI: | https://doi.org/10.1145/3357384.3357911 |
| DBLP: | conf/cikm/SrinivasanRSG19 |
| BibTeX: |
@inproceedings{srinivasan-2019-identifying,
author = {Sriram Srinivasan and
Nikhil S. Rao and
Karthik Subbian and
Lise Getoor},
editor = {Wenwu Zhu and
Dacheng Tao and
Xueqi Cheng and
Peng Cui and
Elke A. Rundensteiner and
David Carmel and
Qi He and
Jeffrey Xu Yu},
title = {{Identifying Facet Mismatches In Search Via Micrographs}},
booktitle = {{Proceedings of the 28th ACM International Conference on Information and Knowledge Management, CIKM 2019, Beijing, China, November 3-7, 2019}},
pages = {1663--1672},
publisher = {ACM},
year = {2019},
url = {https://doi.org/10.1145/3357384.3357911},
doi = {https://doi.org/10.1145/3357384.3357911}
}