Identifying Facet Mismatches In Search Via Micrographs.

Sriram Srinivasan|Nikhil S. Rao|Karthik Subbian|Lise Getoor


Anthology ID:DBLP:conf/cikm/SrinivasanRSG19
Volume:Proceedings of the 28th ACM International Conference on Information and Knowledge Management, CIKM 2019, Beijing, China, November 3-7, 2019.
Year:2019
Venue:International Conference on Information and Knowledge Management (CIKM)
Publisher:ACM
Pages:1663-1672
URL:https://doi.org/10.1145/3357384.3357911
DOI:https://doi.org/10.1145/3357384.3357911
DBLP:conf/cikm/SrinivasanRSG19
BibTeX:
@inproceedings{srinivasan-2019-identifying, author = {Sriram Srinivasan and Nikhil S. Rao and Karthik Subbian and Lise Getoor}, editor = {Wenwu Zhu and Dacheng Tao and Xueqi Cheng and Peng Cui and Elke A. Rundensteiner and David Carmel and Qi He and Jeffrey Xu Yu}, title = {{Identifying Facet Mismatches In Search Via Micrographs}}, booktitle = {{Proceedings of the 28th ACM International Conference on Information and Knowledge Management, CIKM 2019, Beijing, China, November 3-7, 2019}}, pages = {1663--1672}, publisher = {ACM}, year = {2019}, url = {https://doi.org/10.1145/3357384.3357911}, doi = {https://doi.org/10.1145/3357384.3357911} }