Semi-supervised metric learning by maximizing constraint margin.
Fei Wang|Shouchun Chen|Changshui Zhang|Tao Li
| Anthology ID: | DBLP:conf/cikm/WangCZL08 |
|---|---|
| Volume: | Proceedings of the 17th ACM Conference on Information and Knowledge Management, CIKM 2008, Napa Valley, California, USA, October 26-30, 2008 |
| Year: | 2008 |
| Venue: | International Conference on Information and Knowledge Management (CIKM) |
| Publisher: | ACM |
| Pages: | 1457-1458 |
| URL: | https://doi.org/10.1145/1458082.1458331 |
| DOI: | https://doi.org/10.1145/1458082.1458331 |
| DBLP: | conf/cikm/WangCZL08 |
| BibTeX: |
@inproceedings{wang-2008-semisupervised,
author = {Fei Wang and
Shouchun Chen and
Changshui Zhang and
Tao Li},
editor = {James G. Shanahan and
Sihem Amer-Yahia and
Ioana Manolescu and
Yi Zhang and
David A. Evans and
Alek Kolcz and
Key-Sun Choi and
Abdur Chowdhury},
title = {{Semi-supervised metric learning by maximizing constraint margin}},
booktitle = {{Proceedings of the 17th ACM Conference on Information and Knowledge Management, CIKM 2008, Napa Valley, California, USA, October 26-30, 2008}},
pages = {1457--1458},
publisher = {ACM},
year = {2008},
url = {https://doi.org/10.1145/1458082.1458331},
doi = {https://doi.org/10.1145/1458082.1458331}
}